Performance of a Test Coil Wound From Defect-Tolerant Second-Generation Cable
Vyacheslav Solovyov; Ramesh Gupta; William Sampson; Anis Ben Yahia; Hyunwoo Kim; Makoto Takayasu
IEEE Transactions on Applied Superconductivity
Year: 2022 | Volume: 32, Issue: 6 | Journal Article | Publisher: IEEE